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  4am17 silicon n/p channel mos fet high speed power switching ade-208-729 (z) 1st. edition february 1999 features low on-resistance n channel: r ds(on) 0.17 w, v gs = 10 v, i d = 4 a p channel : r ds(on) 0.2 w, v gs = ?0 v, i d = ? a 4 v gate drive devices. high density mounting outline 1 2 3 4 5 6 7 8 9 10 11 12 sp-12 1 g s 3 5 g 8 g 12 g 2 d 4 d 9 d 11 d s 6 s 7 s 10 1, 5, 8, 12. gate 2, 4, 9, 11. drain 3, 6, 7, 10. source
4am17 2 absolute maximum ratings (ta = 25 c) item symbol ratings unit nch pch drain to source voltage v dss 60 ?0 v gate to source voltage v gss 20 20 v drain current i d 88a drain peak current i d(pulse) note1 32 ?2 a body-drain diode reverse drain current i dr 88a channel dissipation pch (tc = 25 c) note2 28 w channel dissipation pch note2 4.0 w channel temperature tch 150 c storage temperature tstg ?5 to +150 c note: 1. pw 10 m s, duty cycle 1% 2. 4 devices operation
4am17 3 electrical characteristics (ta = 25 c) ( n channel ) item symbol min typ max unit test conditions drain to source breakdown voltage v (br)dss 60vi d = 10 ma, v gs = 0 gate to source breakdown voltage v (br)gss 20vi g = 100 m a, v ds = 0 gate to source leak current i gss 10 m av gs = 16 v, v ds = 0 zero gate voltage drain current i dss 250 m av ds = 50 v, v gs = 0 gate to source cutoff voltage v gs(off) 1.0 2.5 v v ds = 10 v, i d = 1 ma static drain to source on state r ds(on) 0.13 0.17 w i d = 4 a, v gs = 10 v note3 resistance r ds(on) 0.19 0.24 w i d = 4 a, v gs = 4 v note3 forward transfer admittance |y fs | 3.5 5.5 s i d = 4 a, v ds = 10 v note3 input capacitance ciss 33 pf v ds = 10 v output capacitance coss 220 pf v gs = 0 reverse transfer capacitance crss 5.2 pf f = 1 mhz gate series resistance rg 1.5 k w v d s = 10 v, v gs = 0 f = 1 mhz turn-on delay time t d(on) 0.15 ns v gs = 10 v, i d = 4 a rise time t r 0.5 ns r l = 7.5 w turn-off delay time t d(off) 3.2 ns fall time t f 1.4 ns body?rain diode forward voltage v df 1.5 v i f = 8 a, v gs = 0 body?rain diode reverse recovery time t rr 850 ns i f = 8 a, v gs = 0 dif/ dt = 50 a/ m s note: 3. pulse test
4am17 4 ( p channel ) item symbol min typ max unit test conditions drain to source breakdown voltage v (br)dss ?0 v i d = ?0 ma, v gs = 0 gate to source breakdown voltage v (br)gss 20v i g = 100 m a, v ds = 0 gate to source leak current i gss 10 m av gs = 16 v, v ds = 0 zero gate voltage drain current i dss ?50 m av ds = ?0 v, v gs = 0 gate to source cutoff voltage v gs(off) ?.0 ?.5 v v ds = ?0 v, i d = ? ma static drain to source on state r ds(on) 0.15 0.2 w i d = ? a, v gs = ?0 v note3 resistance r ds(on) 0.2 0.27 w i d = ? a, v gs = ? v note3 forward transfer admittance |y fs | 3.5 6.0 s i d = ? a, v ds = ?0 v note3 input capacitance ciss 17 pf v ds = ?0 v output capacitance coss 460 pf v gs = 0 reverse transfer capacitance crss 1.2 pf f = 1 mhz gate series resistance rg 3.2 k w v ds = 0, v gs = 0 f = 1 mhz turn-on delay time t d(on) 0.6 ns v gs = ?0 v, i d = ? a rise time t r 2.1 ns r l = 7.5 w turn-off delay time t d(off) ?2ns fall time t f 5.8 ns body?rain diode forward voltage v df ?.2 v i f = ? a, v gs = 0 body?rain diode reverse recovery time t rr 2.5 ns i f = ? a, v gs = 0 dif/ dt = 50 a/ m s note: 3. pulse test
4am17 5 main characteristics 6 5 4 3 2 1 0 collector power dissipation pc (w) 50 100 150 125 ambient temperature tc (?) 75 25 4 device operation 3 device operation 2 device operation 1 device operation each die is is idetical condition : channel dissipation of maximum channel dissipation curve 60 20 10 0 collector power dissipation pc (w) 50 100 150 125 case temperature tc (?) 75 25 4 device operation 3 device operation 2 device operation 1 device operation each die is is idetical condition : channel dissipation of maximum channel dissipation curve 50 drain to source voltage v (v) ds drain current i (a) d maximum safe operation area (n?hannel) 10 1 0.1 0.05 0.1 0.3 1 3 10 30 100 100 ? pw = 10 ms (1shot) operation in this area is limited by r ds(on) 10 ? ta = 25 ? 1 ms dc operation (tc = 25 ?) 20 2 0.2 0.5 5 ?0 drain to source voltage v (v) ds drain current i (a) d maximum safe operation area (p?hannel) ?0 ? ?.1 ?.05 ?.1 ?.3 ? ? ?0 ?0 ?00 100 ? pw = 10 ms (1shot) operation in this area is limited by r ds(on) 10 ? ta = 25 ? 1 ms dc operation (tc = 25 ?) ?0 ? ?.2 ?.5 ?
4am17 6 package dimensions unit: mm 31.0 ?0.3 0.85 ?0.1 1.4 2.54 4.0 ?0.2 1.5 ?0.2 0.55 10.0 ?0.3 10.5 ?0.5 2.7 12 34 56789101112 +0.1 ?.06 hitachi code jedec eiaj sp-12 hitachi code jedec eiaj
cautions 1. hitachi neither warrants nor grants licenses of any rights of hitachi?s or any third party?s patent, copyright, trademark, or other intellectual property rights for information contained in this document. hitachi bears no responsibility for problems that may arise with third party?s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. products and product specifications may be subject to change without notice. confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. hitachi makes every attempt to ensure that its products are of high quality and reliability. however, contact hitachi?s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. design your application so that the product is used within the ranges guaranteed by hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail- safes, so that the equipment incorporating hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the hitachi product. 5. this product is not designed to be radiation resistant. 6. no one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from hitachi. 7. contact hitachi?s sales office for any questions regarding this document or hitachi semiconductor products. hitachi, ltd. semiconductor & integrated circuits. nippon bldg., 2-6-2, ohte-machi, chiyoda-ku, tokyo 100-0004, japan tel: tokyo (03) 3270-2111 fax: (03) 3270-5109 copyright ? hitachi, ltd., 1999. all rights reserved. printed in japan. hitachi asia pte. ltd. 16 collyer quay #20-00 hitachi tower singapore 049318 tel: 535-2100 fax: 535-1533 url northamerica : http:semiconductor.hitachi.com/ europe : http://www.hitachi-eu.com/hel/ecg asia (singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm asia (taiwan) : http://www.hitachi.com.tw/e/product/sicd_frame.htm asia (hongkong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm japan : http://www.hitachi.co.jp/sicd/indx.htm hitachi asia ltd. taipei branch office 3f, hung kuo building. no.167, tun-hwa north road, taipei (105) tel: <886> (2) 2718-3666 fax: <886> (2) 2718-8180 hitachi asia (hong kong) ltd. group iii (electronic components) 7/f., north tower, world finance centre, harbour city, canton road, tsim sha tsui, kowloon, hong kong tel: <852> (2) 735 9218 fax: <852> (2) 730 0281 telex: 40815 hitec hx hitachi europe ltd. electronic components group. whitebrook park lower cookham road maidenhead berkshire sl6 8ya, united kingdom tel: <44> (1628) 585000 fax: <44> (1628) 778322 hitachi europe gmbh electronic components group dornacher strae 3 d-85622 feldkirchen, munich germany tel: <49> (89) 9 9180-0 fax: <49> (89) 9 29 30 00 hitachi semiconductor (america) inc. 179 east tasman drive, san jose,ca 95134 tel: <1> (408) 433-1990 fax: <1>(408) 433-0223 for further information write to:


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